Evaluation of test methods employed for characterizing semi-insulating nature of monocrystaline SiC semiconductor materials

M. F. MacMillan, W. Mitchel, J. Blevins, G. Landis, J. Daniel, R. S. Sandhu, G. Chung, M. Spaulding, T. F. Zoes, E. Emorhokpor, C. Basceri, J. Jenny, E. Berkman, Wolfgang Jantz, W. Eichhorn, A. Blew, J. D. Oliver, Mark Fanton, Tim Bogart, Bill Eversson