TY - GEN
T1 - Evaluation of thin film coating adhesion with an opto-acoustic technique
AU - Flowers, Patrick F.
AU - Yoshida, Sanichiro
AU - Gomi, Kenji
AU - Adhikari, Sushovit
AU - Dreux, Katelyn
AU - Basnet, Mohan
AU - Miyasaka, Chiaki
AU - Tittmann, Bernhard R.
AU - Park, Ik Keun
PY - 2011
Y1 - 2011
N2 - An opto-acoustic technique to evaluate the adhesion strength at the interface of nano-scale thin film systems has been demonstrated. The specimens have been integrated into a Michelson interferometer as the end mirrors, and driven from the rear with an acoustic transducer at moderate frequencies. The resultant film surface displacement has been detected as a fringe shift of the interference intensity pattern behind the beam splitter with a digital imaging device at a normal frame rate. Comparison has been made between strongly and weakly adhered film specimens. The difference in the adhesion strength has been successfully visualized as the difference in the fringe contrast. Fourier analysis on the fringe pattern has quantified the fringe contrast.
AB - An opto-acoustic technique to evaluate the adhesion strength at the interface of nano-scale thin film systems has been demonstrated. The specimens have been integrated into a Michelson interferometer as the end mirrors, and driven from the rear with an acoustic transducer at moderate frequencies. The resultant film surface displacement has been detected as a fringe shift of the interference intensity pattern behind the beam splitter with a digital imaging device at a normal frame rate. Comparison has been made between strongly and weakly adhered film specimens. The difference in the adhesion strength has been successfully visualized as the difference in the fringe contrast. Fourier analysis on the fringe pattern has quantified the fringe contrast.
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U2 - 10.1109/ULTSYM.2011.0271
DO - 10.1109/ULTSYM.2011.0271
M3 - Conference contribution
AN - SCOPUS:84869044847
SN - 9781457712531
T3 - IEEE International Ultrasonics Symposium, IUS
SP - 1103
EP - 1106
BT - 2011 IEEE International Ultrasonics Symposium, IUS 2011
T2 - 2011 IEEE International Ultrasonics Symposium, IUS 2011
Y2 - 18 October 2011 through 21 October 2011
ER -