Evidence of tunnel-assisted transport in nondegenerate MOS and semiconductor-oxide-semiconductor diodes at room temperature

Keyphrases

• Room Temperature 100%
• Oxide Semiconductor 100%
• Non-degenerate 100%
• Semiconductor Diodes 100%
• Assisted Transport 100%
• Semiconductor Oxide 100%
• Temperature Effect 33%
• Transport Mechanism 33%
• Metal Oxide Semiconductor 33%
• Capacitance-voltage 33%
• Metal Oxide 33%
• Conduction Mechanism 33%
• Electrical Characteristics 33%
• P-type 33%
• Current-voltage 33%
• Polysilicon 33%
• Barrier Element 33%
• Indium Tin Oxide 33%
• Diode 33%
• Multicrystalline Silicon 33%
• Minority Carrier Injection 33%
• Thermionic Emission 33%
• Wacker 33%
• Semiconductor Junctions 33%
• Multistep Tunneling 33%

Physics

• Room Temperature 100%
• Semiconductor Diodes 100%
• Single Crystal 33%
• Temperature Dependence 33%
• Metal Oxide Semiconductor 33%
• Thermionic Emission 33%
• Polycrystalline 33%
• Capacitance-Voltage Characteristics 33%
• Indium 33%
• Minority Carriers 33%

Material Science

• Oxide Semiconductor 100%
• Silicon 66%
• Metal Oxide 66%
• Aluminum 33%
• Single Crystal 33%
• Capacitance 33%
• Electrical Property 33%
• Indium Tin Oxide 33%