Evolution of the fractal surface of amorphous lead zirconate-titanate films during crystallization

V. Ya Shur; S. A. Negashev; A. L. Subbotin; D. V. Pelegov; E. A. Borisova; E. B. Blankova; S. Trolier-McKinstry

doi:10.1134/1.1130767

Evolution of the fractal surface of amorphous lead zirconate-titanate films during crystallization

V. Ya Shur, S. A. Negashev, A. L. Subbotin, D. V. Pelegov, E. A. Borisova, E. B. Blankova, S. Trolier-McKinstry

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9 Scopus citations

Abstract

The recrystallization kinetics of amorphous lead zirconate-titanate films prepared by sol-gel technology are investigated experimentally using elastic scattering of light. Sequences of elastic dependences of the scattered light intensity are recorded directly during thermal annealing. The evolution of the morphology of the film surface during annealing is described in terms of the variation of their fractal dimensionalities D_s. The experimental dependences D_s(t) are compared with the results of a computer simulation of the phase transition kinetics in a thin plate (film).

Original language	English (US)
Pages (from-to)	274-277
Number of pages	4
Journal	Physics of the Solid State
Volume	41
Issue number	2
DOIs	https://doi.org/10.1134/1.1130767
State	Published - Feb 1999

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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@article{1a6fb99a0dcb4ca2a453a3d2d921cbe8,

title = "Evolution of the fractal surface of amorphous lead zirconate-titanate films during crystallization",

abstract = "The recrystallization kinetics of amorphous lead zirconate-titanate films prepared by sol-gel technology are investigated experimentally using elastic scattering of light. Sequences of elastic dependences of the scattered light intensity are recorded directly during thermal annealing. The evolution of the morphology of the film surface during annealing is described in terms of the variation of their fractal dimensionalities Ds. The experimental dependences Ds(t) are compared with the results of a computer simulation of the phase transition kinetics in a thin plate (film).",

author = "Shur, {V. Ya} and Negashev, {S. A.} and Subbotin, {A. L.} and Pelegov, {D. V.} and Borisova, {E. A.} and Blankova, {E. B.} and S. Trolier-McKinstry",

note = "Funding Information: This work has received partial support from Grant No. 96-02-19588 of the Russian Fund for Fundamental Research.",

year = "1999",

month = feb,

doi = "10.1134/1.1130767",

language = "English (US)",

volume = "41",

pages = "274--277",

journal = "Physics of the Solid State",

issn = "1063-7834",

publisher = "Pleiades Publishing",

number = "2",

}

TY - JOUR

T1 - Evolution of the fractal surface of amorphous lead zirconate-titanate films during crystallization

AU - Shur, V. Ya

AU - Negashev, S. A.

AU - Subbotin, A. L.

AU - Pelegov, D. V.

AU - Borisova, E. A.

AU - Blankova, E. B.

AU - Trolier-McKinstry, S.

N1 - Funding Information: This work has received partial support from Grant No. 96-02-19588 of the Russian Fund for Fundamental Research.

PY - 1999/2

Y1 - 1999/2

N2 - The recrystallization kinetics of amorphous lead zirconate-titanate films prepared by sol-gel technology are investigated experimentally using elastic scattering of light. Sequences of elastic dependences of the scattered light intensity are recorded directly during thermal annealing. The evolution of the morphology of the film surface during annealing is described in terms of the variation of their fractal dimensionalities Ds. The experimental dependences Ds(t) are compared with the results of a computer simulation of the phase transition kinetics in a thin plate (film).

AB - The recrystallization kinetics of amorphous lead zirconate-titanate films prepared by sol-gel technology are investigated experimentally using elastic scattering of light. Sequences of elastic dependences of the scattered light intensity are recorded directly during thermal annealing. The evolution of the morphology of the film surface during annealing is described in terms of the variation of their fractal dimensionalities Ds. The experimental dependences Ds(t) are compared with the results of a computer simulation of the phase transition kinetics in a thin plate (film).

UR - http://www.scopus.com/inward/record.url?scp=0033243726&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033243726&partnerID=8YFLogxK

U2 - 10.1134/1.1130767

DO - 10.1134/1.1130767

M3 - Article

AN - SCOPUS:0033243726

SN - 1063-7834

VL - 41

SP - 274

EP - 277

JO - Physics of the Solid State

JF - Physics of the Solid State

IS - 2

ER -

Evolution of the fractal surface of amorphous lead zirconate-titanate films during crystallization

Abstract

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