Evolution of threading dislocations in GaN films grown on (111) Si substrates with various buffer layers

X. Weng, J. Acord, A. Jain, S. Raghavan, J. Redwing, E. Dickey

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)906-907
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Aug 2006

All Science Journal Classification (ASJC) codes

  • Instrumentation

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