Evolutionary strategy (ES) to optimize electronic nose sensor selection

Changying Li, Paul Heinemann, Patrick Reed

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The high dimensionality of electronic nose data increases the difficulty of their use in classification models. Reducing this high dimensionality helps reduce variable numbers, improve classification accuracy, and reduce computation time and sensor cost. In this research, the Cyranose 320 electronic nose, which was used for apple defect detection, was optimized by selecting only the most relevant of its internal 32 sensors using different selection methods. The covariance matrix adaptation evolutionary strategy (CMAES), was applied and the average classification error rate of CMA over 30 random seed runs was 5.0% (s.d.=0.006). This study provided a robust and efficient optimization approach to reduce high data dimensionality of the electronic nose data, which substantially improved electronic nose performance in apple defect detection while potentially reducing the overall electronic nose cost for future specific applications.

Original languageEnglish (US)
Title of host publicationComputers in Agriculture and Natural Resources - Proceedings of the 4th World Congress
Pages321-328
Number of pages8
StatePublished - 2006
Event4th World Congress on Computers in Agriculture and Natural Resources - Orlando, FL, United States
Duration: Jul 24 2006Jul 26 2006

Publication series

NameComputers in Agriculture and Natural Resources - Proceedings of the 4th World Congress

Other

Other4th World Congress on Computers in Agriculture and Natural Resources
Country/TerritoryUnited States
CityOrlando, FL
Period7/24/067/26/06

All Science Journal Classification (ASJC) codes

  • Agricultural and Biological Sciences (miscellaneous)
  • Computer Science Applications

Fingerprint

Dive into the research topics of 'Evolutionary strategy (ES) to optimize electronic nose sensor selection'. Together they form a unique fingerprint.

Cite this