Examining Thread Vulnerability analysis using fault-injection

Isil Oz; Haluk Rahmi Topcuoglu; Mahmut Kandemir; Oguz Tosun

doi:10.1109/VLSI-SoC.2013.6673282

Examining Thread Vulnerability analysis using fault-injection

Isil Oz, Haluk Rahmi Topcuoglu, Mahmut Kandemir, Oguz Tosun

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Scopus citations

Abstract

With the scale down of transistor sizes and higher frequencies with low power modes in modern architectures, the chip components become more susceptible to transient errors. Concurrently, multicore machines are replacing traditional single-core machines in most application domains. Thread Vulnerability Factor (TVF) is a metric to evaluate relative soft error vulnerability of multithreaded applications running on multicore architectures. It makes possible vulnerability analysis of parallel programs by providing comparisons between them. In this work, we design a simulation-based fault-injection framework to evaluate soft error vulnerability of parallel applications and perform a validation study to evaluate parallel program vulnerability. The results of the simulation-based fault injection framework is compared with the results based on TVF analysis. Our results demonstrate that TVF provides an efficient vulnerability analysis by having the same ordering and similar vulnerability rates with fault-injection results for a set of multithreaded applications.

Original language	English (US)
Title of host publication	2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration, VLSI-SoC 2013 - Proceedings
Publisher	IEEE Computer Society
Pages	240-245
Number of pages	6
ISBN (Print)	9781479905249
DOIs	https://doi.org/10.1109/VLSI-SoC.2013.6673282
State	Published - 2013
Event	2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration, VLSI-SoC 2013 - Istanbul, Turkey Duration: Oct 7 2013 → Oct 9 2013

Publication series

Name	IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC
ISSN (Print)	2324-8432
ISSN (Electronic)	2324-8440

Other

Other	2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration, VLSI-SoC 2013
Country/Territory	Turkey
City	Istanbul
Period	10/7/13 → 10/9/13

All Science Journal Classification (ASJC) codes

Hardware and Architecture
Software
Electrical and Electronic Engineering

Access to Document

10.1109/VLSI-SoC.2013.6673282

Cite this

Oz, I., Topcuoglu, H. R., Kandemir, M., & Tosun, O. (2013). Examining Thread Vulnerability analysis using fault-injection. In 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration, VLSI-SoC 2013 - Proceedings (pp. 240-245). Article 6673282 (IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC). IEEE Computer Society. https://doi.org/10.1109/VLSI-SoC.2013.6673282

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abstract = "With the scale down of transistor sizes and higher frequencies with low power modes in modern architectures, the chip components become more susceptible to transient errors. Concurrently, multicore machines are replacing traditional single-core machines in most application domains. Thread Vulnerability Factor (TVF) is a metric to evaluate relative soft error vulnerability of multithreaded applications running on multicore architectures. It makes possible vulnerability analysis of parallel programs by providing comparisons between them. In this work, we design a simulation-based fault-injection framework to evaluate soft error vulnerability of parallel applications and perform a validation study to evaluate parallel program vulnerability. The results of the simulation-based fault injection framework is compared with the results based on TVF analysis. Our results demonstrate that TVF provides an efficient vulnerability analysis by having the same ordering and similar vulnerability rates with fault-injection results for a set of multithreaded applications.",

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Oz, I, Topcuoglu, HR, Kandemir, M & Tosun, O 2013, Examining Thread Vulnerability analysis using fault-injection. in 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration, VLSI-SoC 2013 - Proceedings., 6673282, IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC, IEEE Computer Society, pp. 240-245, 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration, VLSI-SoC 2013, Istanbul, Turkey, 10/7/13. https://doi.org/10.1109/VLSI-SoC.2013.6673282

Examining Thread Vulnerability analysis using fault-injection. / Oz, Isil; Topcuoglu, Haluk Rahmi; Kandemir, Mahmut et al.
2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration, VLSI-SoC 2013 - Proceedings. IEEE Computer Society, 2013. p. 240-245 6673282 (IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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Oz I, Topcuoglu HR, Kandemir M, Tosun O. Examining Thread Vulnerability analysis using fault-injection. In 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration, VLSI-SoC 2013 - Proceedings. IEEE Computer Society. 2013. p. 240-245. 6673282. (IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC). doi: 10.1109/VLSI-SoC.2013.6673282

Examining Thread Vulnerability analysis using fault-injection

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