Exciton diffusion lengths of organic semiconductor thin films measured by spectrally resolved photoluminescence quenching

Richard R. Lunt; Noel C. Giebink; Anna A. Belak; Jay B. Benziger; Stephen R. Forrest

doi:10.1063/1.3079797

Exciton diffusion lengths of organic semiconductor thin films measured by spectrally resolved photoluminescence quenching

Richard R. Lunt, Noel C. Giebink, Anna A. Belak, Jay B. Benziger, Stephen R. Forrest

Electrical Engineering

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429 Scopus citations

Abstract

We demonstrate spectrally resolved photoluminescence quenching as a means to determine the exciton diffusion length of several archetype organic semiconductors used in thin film devices. We show that aggregation and crystal orientation influence the anisotropy of the diffusion length for vacuum-deposited polycrystalline films. The measurement of the singlet diffusion lengths is found to be in agreement with diffusion by Förster transfer, whereas triplet diffusion occurs primarily via Dexter transfer.

Original language	English (US)
Article number	053711
Journal	Journal of Applied Physics
Volume	105
Issue number	5
DOIs	https://doi.org/10.1063/1.3079797
State	Published - 2009

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

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10.1063/1.3079797

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abstract = "We demonstrate spectrally resolved photoluminescence quenching as a means to determine the exciton diffusion length of several archetype organic semiconductors used in thin film devices. We show that aggregation and crystal orientation influence the anisotropy of the diffusion length for vacuum-deposited polycrystalline films. The measurement of the singlet diffusion lengths is found to be in agreement with diffusion by F{\"o}rster transfer, whereas triplet diffusion occurs primarily via Dexter transfer.",

author = "Lunt, {Richard R.} and Giebink, {Noel C.} and Belak, {Anna A.} and Benziger, {Jay B.} and Forrest, {Stephen R.}",

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AU - Benziger, Jay B.

AU - Forrest, Stephen R.

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AB - We demonstrate spectrally resolved photoluminescence quenching as a means to determine the exciton diffusion length of several archetype organic semiconductors used in thin film devices. We show that aggregation and crystal orientation influence the anisotropy of the diffusion length for vacuum-deposited polycrystalline films. The measurement of the singlet diffusion lengths is found to be in agreement with diffusion by Förster transfer, whereas triplet diffusion occurs primarily via Dexter transfer.

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Exciton diffusion lengths of organic semiconductor thin films measured by spectrally resolved photoluminescence quenching

Abstract

All Science Journal Classification (ASJC) codes

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