TY - GEN
T1 - Experimental and Computational Evaluation of Thickness-Dependent Reflection Coefficients of Scintillator-Photosensor Interfaces
AU - Logoglu, Faruk
AU - Albert, Patrick E.
AU - Wolfe, Douglas Edward
AU - Flaska, Marek
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - Scintillator-photosensor interface reflection coefficient is a crucial parameter in estimating the absolute light yield (LY) of scintillators as it has an impact on the light transfer efficiency (LTE) of scintillating crystals [1], [2]. Typically, this parameter is assumed to be a single value for a given scintillator-photosensor coupling configuration, and LTE and LY calculations are carried out using this fixed value. However, the light reflection coefficient is known to be dependent on both the angle of incidence and the energy of photons, since the refractive index of a material is an energy-dependent quantity [3]. As the angular and energy distributions of light photons on the scintillator-photosensor interface change as a function of crystal thickness, we hypothesize that the interface reflection coefficient should also change as a function of crystal thickness. We provide Geant4 simulation results to support this hypothesis, and we show the method to estimate the interface reflection coefficient from the simulation results. We use a simplified analytical model to experimentally determine the scintillator-photosensor interface reflection coefficient. Finally, we use our experimental results for four LYSO crystals with different thicknesses [4] to validate the simplified model.
AB - Scintillator-photosensor interface reflection coefficient is a crucial parameter in estimating the absolute light yield (LY) of scintillators as it has an impact on the light transfer efficiency (LTE) of scintillating crystals [1], [2]. Typically, this parameter is assumed to be a single value for a given scintillator-photosensor coupling configuration, and LTE and LY calculations are carried out using this fixed value. However, the light reflection coefficient is known to be dependent on both the angle of incidence and the energy of photons, since the refractive index of a material is an energy-dependent quantity [3]. As the angular and energy distributions of light photons on the scintillator-photosensor interface change as a function of crystal thickness, we hypothesize that the interface reflection coefficient should also change as a function of crystal thickness. We provide Geant4 simulation results to support this hypothesis, and we show the method to estimate the interface reflection coefficient from the simulation results. We use a simplified analytical model to experimentally determine the scintillator-photosensor interface reflection coefficient. Finally, we use our experimental results for four LYSO crystals with different thicknesses [4] to validate the simplified model.
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U2 - 10.1109/NSS/MIC44845.2022.10399291
DO - 10.1109/NSS/MIC44845.2022.10399291
M3 - Conference contribution
AN - SCOPUS:85185377442
T3 - 2022 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference
BT - 2022 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2022 IEEE Nuclear Science Symposium, Medical Imaging Conference, and Room Temperature Semiconductor Detector Conference, IEEE NSS MIC RTSD 2022
Y2 - 5 November 2022 through 12 November 2022
ER -