TY - JOUR
T1 - Experimental study of internal fields and movement of single ferroelectric domain walls
AU - Yang, T. J.
AU - Gopalan, V.
AU - Swart, P.
AU - Mohideen, U.
N1 - Funding Information:
This work was conducted under the auspices of the US Department of Energy, supported (in part) by funds provided by the University of California for the conduct of discretionary research by Los Alamos National Laboratory and Lawrence Livermore National Laboratory under contract W07405-Eng-48.
PY - 2000
Y1 - 2000
N2 - We have made a direct and submicron scale measurement of the strain, internal electric field of single 180° domain walls in ferroelectric LiTaO3 using a collection mode Near-Field Scanning Optical Microscope. We unambiguously identify single domain walls by simultaneously recording nanometer scale topographic and optical images. The birefringence at the domain wall is used in the optical imaging. From the internal field structure we estimate the interface energy. We have also studied the pinning and movement of a single 180° domain wall under an uniform applied electric field. The domain wall was observed to curve between the pinning defects with a radius of curvature uniquely given by the material parameters and the applied electric field. The change in birefringence with applied field is related to the second order electro-optic and piezo-optic coefficients and is used to infer the orientation of the internal field.
AB - We have made a direct and submicron scale measurement of the strain, internal electric field of single 180° domain walls in ferroelectric LiTaO3 using a collection mode Near-Field Scanning Optical Microscope. We unambiguously identify single domain walls by simultaneously recording nanometer scale topographic and optical images. The birefringence at the domain wall is used in the optical imaging. From the internal field structure we estimate the interface energy. We have also studied the pinning and movement of a single 180° domain wall under an uniform applied electric field. The domain wall was observed to curve between the pinning defects with a radius of curvature uniquely given by the material parameters and the applied electric field. The change in birefringence with applied field is related to the second order electro-optic and piezo-optic coefficients and is used to infer the orientation of the internal field.
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U2 - 10.1016/S0022-3697(99)00293-0
DO - 10.1016/S0022-3697(99)00293-0
M3 - Conference article
AN - SCOPUS:0006271632
SN - 0022-3697
VL - 61
SP - 275
EP - 282
JO - Journal of Physics and Chemistry of Solids
JF - Journal of Physics and Chemistry of Solids
IS - 2
T2 - Proceedings of the 1999 Williamsburg Workshop on Ferroelectrics
Y2 - 31 January 1999 through 3 February 1999
ER -