TY - GEN
T1 - Exploiting data longevity for enhancing the lifetime of flash-based storage class memory
AU - Choi, Wonil
AU - Arjomand, Mohammad
AU - Jung, Myoungsoo
AU - Kandemir, Mahmut T.
N1 - Publisher Copyright:
© 2017 ACM.
PY - 2017/6/5
Y1 - 2017/6/5
N2 - This paper proposes to exploit the capability of retention time relaxation in flash memories for improving the lifetime of an SLCbased SSD. The main idea is that as a majority of I/O data in a typical workload do not need a retention time larger than a few days, we can have multiple partial program states in a cell and use every two states to store one-bit data at each time. Thus, we can store multiple bits in a cell (one bit at each time) without erasing it after each write -That would directly translates into lifetime enhancement. The proposed scheme is called Dense-SLC (D-SLC) flash design which improves SSD lifetime by 5.1×-8.6×.
AB - This paper proposes to exploit the capability of retention time relaxation in flash memories for improving the lifetime of an SLCbased SSD. The main idea is that as a majority of I/O data in a typical workload do not need a retention time larger than a few days, we can have multiple partial program states in a cell and use every two states to store one-bit data at each time. Thus, we can store multiple bits in a cell (one bit at each time) without erasing it after each write -That would directly translates into lifetime enhancement. The proposed scheme is called Dense-SLC (D-SLC) flash design which improves SSD lifetime by 5.1×-8.6×.
UR - http://www.scopus.com/inward/record.url?scp=85021792274&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85021792274&partnerID=8YFLogxK
U2 - 10.1145/3078505.3078527
DO - 10.1145/3078505.3078527
M3 - Conference contribution
AN - SCOPUS:85021792274
T3 - SIGMETRICS 2017 Abstracts - Proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems
SP - 53
BT - SIGMETRICS 2017 Abstracts - Proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems
PB - Association for Computing Machinery, Inc
T2 - 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS 2017
Y2 - 5 June 2017 through 9 June 2017
ER -