TY - GEN
T1 - Exploiting ferroelectric FETs for low-power non-volatile logic-in-memory circuits
AU - Yin, Xunzhao
AU - Aziz, Ahmedullah
AU - Nahas, Joseph
AU - Datta, Suman
AU - Gupta, Sumeet
AU - Niemier, Michael
AU - Hu, Xiaobo Sharon
N1 - Publisher Copyright:
© 2016 ACM.
PY - 2016/11/7
Y1 - 2016/11/7
N2 - Numerous research efforts are targeting new devices that could continue performance scaling trends associated with Moore's Law and/or accomplish computational tasks with less energy. One such device is the ferroelectric FET (FeFET), which offers the potential to be scaled beyond the end of the silicon roadmap as predicted by ITRS. Furthermore, the Ids vs. Vgs characteristics of FeFETs may allow a device to function as both a switch and a non-volatile storage element. We exploit this FeFET property to enable fine-grained logic-in-memory (LiM). We consider three different circuit design styles for FeFET-based LiM: complementary (differential), dynamic current mode, and dynamic logic. Our designs are compared with existing approaches for LiM (i.e., based on magnetic tunnel junctions (MTJs), CMOS, etc.) that afford the same circuit-level functionality. Assuming similar feature sizes, non-volatile FeFET-based LiM circuits are more efficient than functional equivalents based on MTJs when considering metrics such as propagation delay (2.9X, 6.8X) and dyanmic power (3.7X, 2.3X) (for 45 nm, 22 nm technology respectively). Compared to CMOS functional equivalents, FeFET designs still exhibit modest improvements in the aforementioned metrics while also offering non-volatility and reduced device count.
AB - Numerous research efforts are targeting new devices that could continue performance scaling trends associated with Moore's Law and/or accomplish computational tasks with less energy. One such device is the ferroelectric FET (FeFET), which offers the potential to be scaled beyond the end of the silicon roadmap as predicted by ITRS. Furthermore, the Ids vs. Vgs characteristics of FeFETs may allow a device to function as both a switch and a non-volatile storage element. We exploit this FeFET property to enable fine-grained logic-in-memory (LiM). We consider three different circuit design styles for FeFET-based LiM: complementary (differential), dynamic current mode, and dynamic logic. Our designs are compared with existing approaches for LiM (i.e., based on magnetic tunnel junctions (MTJs), CMOS, etc.) that afford the same circuit-level functionality. Assuming similar feature sizes, non-volatile FeFET-based LiM circuits are more efficient than functional equivalents based on MTJs when considering metrics such as propagation delay (2.9X, 6.8X) and dyanmic power (3.7X, 2.3X) (for 45 nm, 22 nm technology respectively). Compared to CMOS functional equivalents, FeFET designs still exhibit modest improvements in the aforementioned metrics while also offering non-volatility and reduced device count.
UR - http://www.scopus.com/inward/record.url?scp=85000978505&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85000978505&partnerID=8YFLogxK
U2 - 10.1145/2966986.2967037
DO - 10.1145/2966986.2967037
M3 - Conference contribution
AN - SCOPUS:85000978505
T3 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
BT - 2016 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 35th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2016
Y2 - 7 November 2016 through 10 November 2016
ER -