Extending classical test to quantum

Jacob D. Biamonte; Minki Jeong; Jae Seung Lee; Marek A. Perkowski

doi:10.1117/12.623715

Extending classical test to quantum

Jacob D. Biamonte, Minki Jeong, Jae Seung Lee, Marek A. Perkowski

Mathematics

Research output: Contribution to journal › Conference article › peer-review

Abstract

We first introduce a method called quantum path verification, where we search for a break in a quantum network. After explaining these capabilities, we address gate internal faults. We present new fault models to represent crosstalk and unwanted nearest neighbor entanglement. When witnessed, these errors are probabilistic, but there is a set of tests that has the highest probability of detecting a fault. We introduce a method of probabilistic set covering to identify this set of tests. A large part of our work consisted of writing a software package that allows us to compare various fault models and test strategies.

Original language	English (US)
Article number	43
Pages (from-to)	194-205
Number of pages	12
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	5842
DOIs	https://doi.org/10.1117/12.623715
State	Published - 2005
Event	Fluctuations and Noise in Photonics and Quantum Optics III - Austin, TX, United States Duration: May 24 2005 → May 26 2005

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.623715

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AU - Biamonte, Jacob D.

AU - Jeong, Minki

AU - Lee, Jae Seung

AU - Perkowski, Marek A.

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AB - We first introduce a method called quantum path verification, where we search for a break in a quantum network. After explaining these capabilities, we address gate internal faults. We present new fault models to represent crosstalk and unwanted nearest neighbor entanglement. When witnessed, these errors are probabilistic, but there is a set of tests that has the highest probability of detecting a fault. We introduce a method of probabilistic set covering to identify this set of tests. A large part of our work consisted of writing a software package that allows us to compare various fault models and test strategies.

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SP - 194

EP - 205

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

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T2 - Fluctuations and Noise in Photonics and Quantum Optics III

Y2 - 24 May 2005 through 26 May 2005

ER -

Extending classical test to quantum

Abstract

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