Abstract
An extension of Hodgkinson's model for the principal refractive indexes and column-inclination angle of a columnar thin film against the vapor-incidence angle is presented for an extraordinary refractive index relevant for many optical applications. Not only do the principal refractive indexes depend quadratically on the vapor incidence angle, but the extraordinary refractive index does as well. This model is expected to be valid for chiral sculptured thin films as well.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 72-73 |
| Number of pages | 2 |
| Journal | Microwave and Optical Technology Letters |
| Volume | 42 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jul 5 2004 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering