Extension of Hodgkinson's model for optical characterization of columnar thin films

Francesco Chiadini, Akhlesh Lakhtakia

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

An extension of Hodgkinson's model for the principal refractive indexes and column-inclination angle of a columnar thin film against the vapor-incidence angle is presented for an extraordinary refractive index relevant for many optical applications. Not only do the principal refractive indexes depend quadratically on the vapor incidence angle, but the extraordinary refractive index does as well. This model is expected to be valid for chiral sculptured thin films as well.

Original languageEnglish (US)
Pages (from-to)72-73
Number of pages2
JournalMicrowave and Optical Technology Letters
Volume42
Issue number1
DOIs
StatePublished - Jul 5 2004

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Extension of Hodgkinson's model for optical characterization of columnar thin films'. Together they form a unique fingerprint.

Cite this