Extraction of current signatures for simulation of simultaneous switching noise in high speed digital systems

Rohan Mandrekar; Madhavan Swaminathan; Sungjun Chun

doi:10.1109/EPEP.2003.1249996

Extraction of current signatures for simulation of simultaneous switching noise in high speed digital systems

Rohan Mandrekar, Madhavan Swaminathan, Sungjun Chun

Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

5 Scopus citations

Abstract

This paper describes a measurement based approach for extraction of the current signature to simulate switching noise in complex high speed systems. The approach is tested on a high speed functioning computer system from Sun Microsystems. Using the current source developed, simultaneous switching noise in the core power distribution network of the system has been simulated with good accuracy.

Original language	English (US)
Title of host publication	Electrical Performance of Electronic Packaging
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	41-44
Number of pages	4
ISBN (Electronic)	0780381289, 9780780381285
DOIs	https://doi.org/10.1109/EPEP.2003.1249996
State	Published - 2003
Event	Electrical Performance of Electronic Packaging, 2003 - Princeton, United States Duration: Oct 27 2003 → Oct 29 2003

Publication series

Name	Electrical Performance of Electronic Packaging

Conference

Conference	Electrical Performance of Electronic Packaging, 2003
Country/Territory	United States
City	Princeton
Period	10/27/03 → 10/29/03

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
Hardware and Architecture

Access to Document

10.1109/EPEP.2003.1249996

Cite this

Mandrekar, R., Swaminathan, M., & Chun, S. (2003). Extraction of current signatures for simulation of simultaneous switching noise in high speed digital systems. In Electrical Performance of Electronic Packaging (pp. 41-44). Article 1249996 (Electrical Performance of Electronic Packaging). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EPEP.2003.1249996

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title = "Extraction of current signatures for simulation of simultaneous switching noise in high speed digital systems",

abstract = "This paper describes a measurement based approach for extraction of the current signature to simulate switching noise in complex high speed systems. The approach is tested on a high speed functioning computer system from Sun Microsystems. Using the current source developed, simultaneous switching noise in the core power distribution network of the system has been simulated with good accuracy.",

author = "Rohan Mandrekar and Madhavan Swaminathan and Sungjun Chun",

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year = "2003",

doi = "10.1109/EPEP.2003.1249996",

language = "English (US)",

series = "Electrical Performance of Electronic Packaging",

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Mandrekar, R, Swaminathan, M & Chun, S 2003, Extraction of current signatures for simulation of simultaneous switching noise in high speed digital systems. in Electrical Performance of Electronic Packaging., 1249996, Electrical Performance of Electronic Packaging, Institute of Electrical and Electronics Engineers Inc., pp. 41-44, Electrical Performance of Electronic Packaging, 2003, Princeton, United States, 10/27/03. https://doi.org/10.1109/EPEP.2003.1249996

Extraction of current signatures for simulation of simultaneous switching noise in high speed digital systems. / Mandrekar, Rohan; Swaminathan, Madhavan; Chun, Sungjun.
Electrical Performance of Electronic Packaging. Institute of Electrical and Electronics Engineers Inc., 2003. p. 41-44 1249996 (Electrical Performance of Electronic Packaging).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AU - Swaminathan, Madhavan

AU - Chun, Sungjun

PY - 2003

Y1 - 2003

N2 - This paper describes a measurement based approach for extraction of the current signature to simulate switching noise in complex high speed systems. The approach is tested on a high speed functioning computer system from Sun Microsystems. Using the current source developed, simultaneous switching noise in the core power distribution network of the system has been simulated with good accuracy.

AB - This paper describes a measurement based approach for extraction of the current signature to simulate switching noise in complex high speed systems. The approach is tested on a high speed functioning computer system from Sun Microsystems. Using the current source developed, simultaneous switching noise in the core power distribution network of the system has been simulated with good accuracy.

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BT - Electrical Performance of Electronic Packaging

PB - Institute of Electrical and Electronics Engineers Inc.

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ER -

Extraction of current signatures for simulation of simultaneous switching noise in high speed digital systems

Abstract

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