Extraction of electrical parameters of high density connectors using time domain measurements

Sreemala Pannala, Christine Nguyen, Madhavan Swaminathan

Research output: Contribution to journalConference articlepeer-review

4 Scopus citations

Abstract

This paper discusses the extraction of the equivalent circuit of connector pins using time domain measurement and SPICE without relying on any modeling tools. Two coupled connector pins can be represented by an equivalent circuit consisting of six parameters, namely, self capacitance/self inductance per pin, mutual capacitance between pins and mutual inductance between pins. To extract these parameters from time domain measurements is therefore a non-trivial task since variation of any one of these parameters could produce a change in the total response. Hence a systematic extraction algorithm has been discussed in this paper using a combination of stand-alone, common mode and differential mode measurements.

Original languageEnglish (US)
Pages (from-to)936-941
Number of pages6
JournalProceedings - Electronic Components and Technology Conference
StatePublished - 1997
EventProceedings of the 1997 47th IEEE Electronic Components & Technology Conference - San Jose, CA, USA
Duration: May 18 1997May 21 1997

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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