Extraction of S-parameters from TDR/TDT measurements using rational functions

Sreemala Pannala, Madhavan Swaminathan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

This paper discusses the extraction of broad band S-parameter response from transient reflection and transmission measurements. The method discussed uses the Generalized Pencil-of-Function method, recursive deconvolution and time referencing to develop models using rational functions. A low loss printed circuit board plane and a lossy thin film plane have been characterized using this method to extract the two-port S-parameters. These models are SPICE compatible and can be used to simulate the frequency or transient response. The results have been compared with network analyzer measurements to show the accuracy.

Original languageEnglish (US)
Title of host publication54th ARFTG Conference Digest Fall 1999
Subtitle of host publicationAutomatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)0780356861, 9780780356863
DOIs
StatePublished - 1999
Event54th Automatic RF Techniques Group, ARFTG Fall 1999 - Atlanta, United States
Duration: Dec 2 1999Dec 3 1999

Publication series

Name54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999

Conference

Conference54th Automatic RF Techniques Group, ARFTG Fall 1999
Country/TerritoryUnited States
CityAtlanta
Period12/2/9912/3/99

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Instrumentation

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