Abstract
The extraction of the broad band S-parameter response from transient reflection and transmission measurements is discussed. The proposed method uses the generalized pencil-of-function method, recursive deconvolution, and calibration structures to obtain a response using rational functions. A low loss printed circuit board plane and a lossy thin film plane are characterized to capture the two-port S-parameters. The results are compared with network analyzer measurements. The effects of the measurement parameters such as the sampling interval, time window, and number of averages are shown. The effect of time jitter on the extracted frequency response is quantified through repeated measurements.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 74-85 |
| Number of pages | 12 |
| Journal | International Journal of RF and Microwave Computer-Aided Engineering |
| Volume | 13 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jan 2003 |
All Science Journal Classification (ASJC) codes
- Computer Science Applications
- Computer Graphics and Computer-Aided Design
- Electrical and Electronic Engineering