@inproceedings{f1817203ae234ca69e63693867a88ef3,
title = "Extraction of the frequency-dependent characteristic impedance of transmission lines using TDR measurements",
abstract = "This paper discusses a method for measuring the frequency-dependent characteristic impedance of transmission lines using time domain reflectometry (TDR) measurements with an open, short and load calibration. Conventional characterization methods using a network analyzer require precise information on the structure of the transmission line to extract the characteristic impedance, which can be cumbersome. In TDR measurements, the effect of the load can be removed using time windowing, which can reduce the error in the measurements. The results of TDR measurements have been compared with those of a network analyzer to quantify the measurement error. Both a low pass filter and a PCB microstrip line have been characterized using this method.",
author = "Woopoung Kim and M. Swaminathan and Li, {Y. L.}",
note = "Publisher Copyright: {\textcopyright} 2000 IEEE.; 3rd Electronics Packaging Technology Conference, EPTC 2000 ; Conference date: 05-12-2000 Through 07-12-2000",
year = "2000",
doi = "10.1109/EPTC.2000.906372",
language = "English (US)",
series = "Proceedings of the Electronic Packaging Technology Conference, EPTC",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "191--197",
editor = "Charles Lee and Toh, {Kok Chuan} and Lim, {Thiam Beng}",
booktitle = "Proceedings of 3rd Electronics Packaging Technology Conference, EPTC 2000",
address = "United States",
}