Extrinsic contributions to the grain size dependence of relaxor ferroelectric Pb(Mg1/3Nb2/3)O3: PbTiO3 ceramics

C. A. Randall; A. D. Hilton; D. J. Barber

doi:10.1557/JMR.1993.0880

Extrinsic contributions to the grain size dependence of relaxor ferroelectric Pb(Mg1/3Nb2/3)O3: PbTiO3 ceramics

C. A. Randall, A. D. Hilton, D. J. Barber

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Abstract

This paper addresses the observed grain size with dependence of the dielectric behavior for Pb(Mg1/3Nb2/3)O3: PbTiO3 ceramics grain sizes ≥1.0 μm. A combined transmission electron microscopy (TEM) analysis and dielectric characterization are modeled with a modified brick wall approach. From this model, it is possible to extrapolate information such as single crystal values of dielectric maximum, Kmax, the diffuseness coefficient, δ, and the average intergranular thickness for relaxor ceramics. The calculated intergranular thickness agrees well with TEM observations, ≃2.0 nm. This semi-empirical method may be potentially useful in development work of relaxor ceramics to predict the optimized dielectric properties obtainable within microstructural restrictions.

Original language	English (US)
Pages (from-to)	880-884
Number of pages	5
Journal	Journal of Materials Research
Volume	8
Issue number	4
DOIs	https://doi.org/10.1557/JMR.1993.0880
State	Published - Apr 1993

All Science Journal Classification (ASJC) codes

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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title = "Extrinsic contributions to the grain size dependence of relaxor ferroelectric Pb(Mg1/3Nb2/3)O3: PbTiO3 ceramics",

abstract = "This paper addresses the observed grain size with dependence of the dielectric behavior for Pb(Mg1/3Nb2/3)O3: PbTiO3 ceramics grain sizes ≥1.0 μm. A combined transmission electron microscopy (TEM) analysis and dielectric characterization are modeled with a modified brick wall approach. From this model, it is possible to extrapolate information such as single crystal values of dielectric maximum, Kmax, the diffuseness coefficient, δ, and the average intergranular thickness for relaxor ceramics. The calculated intergranular thickness agrees well with TEM observations, ≃2.0 nm. This semi-empirical method may be potentially useful in development work of relaxor ceramics to predict the optimized dielectric properties obtainable within microstructural restrictions.",

author = "Randall, {C. A.} and Hilton, {A. D.} and Barber, {D. J.}",

note = "Funding Information: We wish to thank JoAnn Mantz for typing this manuscript and Beth Jones for technical assistance. This was partly supported by the Office of Naval Research and the Center for Dielectric Studies at The Pennsylvania State University.",

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AU - Randall, C. A.

AU - Hilton, A. D.

AU - Barber, D. J.

N1 - Funding Information: We wish to thank JoAnn Mantz for typing this manuscript and Beth Jones for technical assistance. This was partly supported by the Office of Naval Research and the Center for Dielectric Studies at The Pennsylvania State University.

PY - 1993/4

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N2 - This paper addresses the observed grain size with dependence of the dielectric behavior for Pb(Mg1/3Nb2/3)O3: PbTiO3 ceramics grain sizes ≥1.0 μm. A combined transmission electron microscopy (TEM) analysis and dielectric characterization are modeled with a modified brick wall approach. From this model, it is possible to extrapolate information such as single crystal values of dielectric maximum, Kmax, the diffuseness coefficient, δ, and the average intergranular thickness for relaxor ceramics. The calculated intergranular thickness agrees well with TEM observations, ≃2.0 nm. This semi-empirical method may be potentially useful in development work of relaxor ceramics to predict the optimized dielectric properties obtainable within microstructural restrictions.

AB - This paper addresses the observed grain size with dependence of the dielectric behavior for Pb(Mg1/3Nb2/3)O3: PbTiO3 ceramics grain sizes ≥1.0 μm. A combined transmission electron microscopy (TEM) analysis and dielectric characterization are modeled with a modified brick wall approach. From this model, it is possible to extrapolate information such as single crystal values of dielectric maximum, Kmax, the diffuseness coefficient, δ, and the average intergranular thickness for relaxor ceramics. The calculated intergranular thickness agrees well with TEM observations, ≃2.0 nm. This semi-empirical method may be potentially useful in development work of relaxor ceramics to predict the optimized dielectric properties obtainable within microstructural restrictions.

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Extrinsic contributions to the grain size dependence of relaxor ferroelectric Pb(Mg1/3Nb2/3)O3: PbTiO3 ceramics

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