Extrinsic scaling effects on the dielectric response of ferroelectric thin films

Jon F. Ihlefeld, Aaron M. Vodnick, Shefford P. Baker, William J. Borland, Jon Paul Maria

Research output: Contribution to journalArticlepeer-review

48 Scopus citations

Fingerprint

Dive into the research topics of 'Extrinsic scaling effects on the dielectric response of ferroelectric thin films'. Together they form a unique fingerprint.

Physics & Astronomy