Faint near-ultraviolet/far-ultraviolet standards from swift/uvot, galex, and SDSS photometry
- Michael H. Siegel
- , Erik A. Hoversten
- , Peter W.A. Roming
- , Wayne B. Landsman
- , Carlos Allende Prieto
- , Alice A. Breeveld
- , Peter Brown
- , Stephen T. Holland
- , N. P.M. Kuin
- , Mathew J. Page
- , Daniel E. Vanden Berk
Research output: Contribution to journal › Article › peer-review
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