Faint near-ultraviolet/far-ultraviolet standards from swift/uvot, galex, and SDSS photometry

Michael H. Siegel, Erik A. Hoversten, Peter W.A. Roming, Wayne B. Landsman, Carlos Allende Prieto, Alice A. Breeveld, Peter Brown, Stephen T. Holland, N. P.M. Kuin, Mathew J. Page, Daniel E. Vanden Berk

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