TY - JOUR
T1 - Fault detection and automated fault diagnosis for embedded integrated electrical passives
AU - Yoon, Heebyung
AU - Hou, Junwei
AU - Bhattacharya, Swapan K.
AU - Chatterjee, Abhijit
AU - Swaminathan, Madhavan
PY - 1999
Y1 - 1999
N2 - In this paper, we propose a novel test technique for fault detection and automated fault diagnosis using pole/zero analysis of embedded integrated passives. For performing pole/zero analysis, an ensemble of circuits obtained by perturbing the circuit under test parameters using their known statistical distributions is generated. From knowledge of the passive circuit specifications, the poles and zeros of every such circuit are extracted and pass and fail regions for the critical poles and zeros are computed in the real-imaginary plane. The proposed test technique uses a region-matching algorithm to detect faults and perform automated diagnosis of catastrophic and parametric faults using frequency domain 2-port measurements. A practical example is presented in order to verify the proposed pole/zero analysis using the fabricated embedded RC device.
AB - In this paper, we propose a novel test technique for fault detection and automated fault diagnosis using pole/zero analysis of embedded integrated passives. For performing pole/zero analysis, an ensemble of circuits obtained by perturbing the circuit under test parameters using their known statistical distributions is generated. From knowledge of the passive circuit specifications, the poles and zeros of every such circuit are extracted and pass and fail regions for the critical poles and zeros are computed in the real-imaginary plane. The proposed test technique uses a region-matching algorithm to detect faults and perform automated diagnosis of catastrophic and parametric faults using frequency domain 2-port measurements. A practical example is presented in order to verify the proposed pole/zero analysis using the fabricated embedded RC device.
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U2 - 10.1023/A:1008187207518
DO - 10.1023/A:1008187207518
M3 - Article
AN - SCOPUS:0032653154
SN - 0922-5773
VL - 21
SP - 265
EP - 276
JO - Journal of VLSI Signal Processing Systems for Signal, Image, and Video Technology
JF - Journal of VLSI Signal Processing Systems for Signal, Image, and Video Technology
IS - 3
ER -