Fault detection and automated fault diagnosis for embedded integrated electrical passives

Heebyung Yoon, Junwei Hou, Swapan K. Bhattacharya, Abhijit Chatterjee, Madhavan Swaminathan

Research output: Contribution to journalArticlepeer-review

6 Scopus citations


In this paper, we propose a novel test technique for fault detection and automated fault diagnosis using pole/zero analysis of embedded integrated passives. For performing pole/zero analysis, an ensemble of circuits obtained by perturbing the circuit under test parameters using their known statistical distributions is generated. From knowledge of the passive circuit specifications, the poles and zeros of every such circuit are extracted and pass and fail regions for the critical poles and zeros are computed in the real-imaginary plane. The proposed test technique uses a region-matching algorithm to detect faults and perform automated diagnosis of catastrophic and parametric faults using frequency domain 2-port measurements. A practical example is presented in order to verify the proposed pole/zero analysis using the fabricated embedded RC device.

Original languageEnglish (US)
Pages (from-to)265-276
Number of pages12
JournalJournal of VLSI Signal Processing Systems for Signal, Image, and Video Technology
Issue number3
StatePublished - 1999

All Science Journal Classification (ASJC) codes

  • Signal Processing
  • Information Systems
  • Electrical and Electronic Engineering


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