Fault detection and automated fault diagnosis for embedded integrated electrical passives

Heebyung Yoon, Junwei Hou, Abhijit Chatterjee, Madhavan Swaminathan

Research output: Contribution to conferencePaperpeer-review

11 Scopus citations

Abstract

In this paper, we propose a novel test technique for fault detection and automated fault diagnosis using pole/zero analysis of embedded integrated passive. For pole/zero analysis, an ensemble of circuits obtained by perturbing the circuit under test parameters using their known statistical distributions is generated. The poles and zeros of every circuit in this ensemble are extracted. From knowledge of the passive circuit specifications, pass and fail regions for the critical poles and zeros are computed in the real-imaginary plane. The proposed test technique uses a region-matching algorithm to detect faults and perform automated diagnosis of catastrophic and parametric faults using frequency domain 2-port measurements.

Original languageEnglish (US)
Pages588-593
Number of pages6
StatePublished - 1998
EventProceedings of the 1998 IEEE International Conference on Computer Design - Austin, TX, USA
Duration: Oct 5 1998Oct 7 1998

Conference

ConferenceProceedings of the 1998 IEEE International Conference on Computer Design
CityAustin, TX, USA
Period10/5/9810/7/98

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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