Ferroelastic phase transition compositional dependence for solid-solution [(Li0.5Bi0.5)xBi1- x][MoxV1-x]O4 scheelite-structured microwave dielectric ceramics

D. Zhou, W. G. Qu, C. A. Randall, L. X. Pang, H. Wang, X. G. Wu, J. Guo, G. Q. Zhang, L. Shui, Q. P. Wang, H. C. Liu, X. Yao

Research output: Contribution to journalArticlepeer-review

59 Scopus citations

Abstract

A compositional dependence on the ferroelastic phase transition in scheelite solid-solution [(Li0.5Bi0.5)xBi 1-x][MoxV1-x]O 4 ceramics was characterized by the microwave dielectric data over the temperature range 10-420 K. As x values increased from 0.0 to 0.125, a dielectric temperature-dependent anomaly consistent with a phase transition decreased linearly from 528 K for the pure BiVO4 end member to 264 K for the solid-solution composition at x = 0.125. With further increasing x, the transition temperature decreased sharply to approximately 45 K and became stable for x ≥ 0.52. The phase transition point for pure tetragonal (Li 0.5Bi0.5)MoO4 ceramics is approximately 43 K. As the x value increases, the Raman band of the [(Li0.5Bi 0.5)xBi1-x][MoxV 1-x]O4 ceramics at room temperature broadens and overlaps. Ferroelastic domain structures were observed as a function of composition with diffraction contrast imaging and high-resolution imaging with transmission electron microscopy. Structure-property relations are inferred from the microscopy observations and the Raman spectra.

Original languageEnglish (US)
Pages (from-to)1502-1509
Number of pages8
JournalActa Materialia
Volume59
Issue number4
DOIs
StatePublished - Feb 2011

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

Fingerprint

Dive into the research topics of 'Ferroelastic phase transition compositional dependence for solid-solution [(Li0.5Bi0.5)xBi1- x][MoxV1-x]O4 scheelite-structured microwave dielectric ceramics'. Together they form a unique fingerprint.

Cite this