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Ferroelastic phase transition compositional dependence for solid-solution [(Li0.5Bi0.5)xBi1- x][MoxV1-x]O4 scheelite-structured microwave dielectric ceramics

  • D. Zhou
  • , W. G. Qu
  • , C. A. Randall
  • , L. X. Pang
  • , H. Wang
  • , X. G. Wu
  • , J. Guo
  • , G. Q. Zhang
  • , L. Shui
  • , Q. P. Wang
  • , H. C. Liu
  • , X. Yao

Research output: Contribution to journalArticlepeer-review

Abstract

A compositional dependence on the ferroelastic phase transition in scheelite solid-solution [(Li0.5Bi0.5)xBi 1-x][MoxV1-x]O 4 ceramics was characterized by the microwave dielectric data over the temperature range 10-420 K. As x values increased from 0.0 to 0.125, a dielectric temperature-dependent anomaly consistent with a phase transition decreased linearly from 528 K for the pure BiVO4 end member to 264 K for the solid-solution composition at x = 0.125. With further increasing x, the transition temperature decreased sharply to approximately 45 K and became stable for x ≥ 0.52. The phase transition point for pure tetragonal (Li 0.5Bi0.5)MoO4 ceramics is approximately 43 K. As the x value increases, the Raman band of the [(Li0.5Bi 0.5)xBi1-x][MoxV 1-x]O4 ceramics at room temperature broadens and overlaps. Ferroelastic domain structures were observed as a function of composition with diffraction contrast imaging and high-resolution imaging with transmission electron microscopy. Structure-property relations are inferred from the microscopy observations and the Raman spectra.

Original languageEnglish (US)
Pages (from-to)1502-1509
Number of pages8
JournalActa Materialia
Volume59
Issue number4
DOIs
StatePublished - Feb 2011

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

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