Abstract
Ferroelectric Pb (Zrx Ti1-x)O3 (PZT) thin films were deposited on magnetostrictive nickel substrate and fused quartz using chemical solution deposition (CSD) technique. The remanent polarization and coercive field values were observed to be 50 µC/cm2 and 125 kV/cm at an applied field of 35 V. The dependence of remanent polarization under magnetic field showed a significant modulation of charge 12 µC/cm2 at 3.2 kOe for PZT film deposited on nickel. These results show great potential of implementing the PZT/Ni system for AC magnetic field sensors and dual phase energy harvesting devices. The PZT thin film on fused quartz substrate exhibited good transmittance (>85%) in the visible region and band gap of direct optical transition is found to be 4.1 eV.
Original language | English (US) |
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Pages (from-to) | 1116-1119 |
Number of pages | 4 |
Journal | Advanced Science Letters |
Volume | 20 |
Issue number | 5-6 |
DOIs | |
State | Published - May 1 2014 |
All Science Journal Classification (ASJC) codes
- Computer Science(all)
- Health(social science)
- Mathematics(all)
- Education
- Environmental Science(all)
- Engineering(all)
- Energy(all)