Ferroelectric and piezoelectric properties of epitaxial Pb(Yb1/2Nb1/2)O3-PbTiO3 films

Takeshi Yoshimura, Susan E. Trolier-McKinstry

Research output: Contribution to journalArticlepeer-review

Abstract

(1-x)Pb(Yb1/2Nb1/2)O3-xPbTiO 3(PYbN-PT, x=0.5) epitaxial films were grown on (001)SrRuO3/(001)LaAlO3 and (111)SrRuO3/(111)SrTiO3 substrates by pulsed laser deposition. (001)PYbN-PT epitaxial films with high phase purity and good crystalline quality were obtained for a wide range of deposition rates (60-90 nm/min) and temperatures (620-680°C). (111)PYbN-PT films were also obtained at temperatures in the range of 600°C to 620°C. The ferroelectric and piezoelectric properties were investigated on both (001) and (111) PYbN-PT films. The remanent polarizations of (001)PYbN-PT and (111)PYbN-PT films were as high as 34 μC/cm2 and 26 μC/cm2, respectively. On (001)PYbN-PT films with a thickness of 900 nm, an e31 coefficient of -13 C/m2 and an aging rate of 2.5% per decade were observed.

Original languageEnglish (US)
JournalMaterials Research Society Symposium - Proceedings
Volume655
StatePublished - Dec 1 2001

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials

Fingerprint

Dive into the research topics of 'Ferroelectric and piezoelectric properties of epitaxial Pb(Yb1/2Nb1/2)O3-PbTiO3 films'. Together they form a unique fingerprint.

Cite this