Ferroelectric domain imaging by defect-luminescence microscopy

V. Dierolf; C. Sandmann; S. Kim; V. Gopalan; K. Polgar

doi:10.1063/1.1538333

Ferroelectric domain imaging by defect-luminescence microscopy

V. Dierolf, C. Sandmann, S. Kim, V. Gopalan, K. Polgar

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44 Scopus citations

Abstract

The role of defects within the domain inversion process in ferroelectric LiNbO₃ crystals was studied by investigating the optical properties of intentionally introduced Er³⁺ defect complexes. Drastic differences in the Er³⁺ emission were found using site-selective excitation-emission spectroscopy, which were due to a rearrangement of the defect complexes. The changes were used in a confocal luminescence microscope to image ferroelectric-domain structures.

Original language	English (US)
Pages (from-to)	2295-2297
Number of pages	3
Journal	Journal of Applied Physics
Volume	93
Issue number	4
DOIs	https://doi.org/10.1063/1.1538333
State	Published - Feb 15 2003

All Science Journal Classification (ASJC) codes

Physics and Astronomy(all)

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10.1063/1.1538333

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@article{2014c80e7ef34ea4b4c086c635b2570a,

title = "Ferroelectric domain imaging by defect-luminescence microscopy",

abstract = "The role of defects within the domain inversion process in ferroelectric LiNbO3 crystals was studied by investigating the optical properties of intentionally introduced Er3+ defect complexes. Drastic differences in the Er3+ emission were found using site-selective excitation-emission spectroscopy, which were due to a rearrangement of the defect complexes. The changes were used in a confocal luminescence microscope to image ferroelectric-domain structures.",

author = "V. Dierolf and C. Sandmann and S. Kim and V. Gopalan and K. Polgar",

year = "2003",

month = feb,

day = "15",

doi = "10.1063/1.1538333",

language = "English (US)",

volume = "93",

pages = "2295--2297",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

number = "4",

}

TY - JOUR

T1 - Ferroelectric domain imaging by defect-luminescence microscopy

AU - Dierolf, V.

AU - Sandmann, C.

AU - Kim, S.

AU - Gopalan, V.

AU - Polgar, K.

PY - 2003/2/15

Y1 - 2003/2/15

N2 - The role of defects within the domain inversion process in ferroelectric LiNbO3 crystals was studied by investigating the optical properties of intentionally introduced Er3+ defect complexes. Drastic differences in the Er3+ emission were found using site-selective excitation-emission spectroscopy, which were due to a rearrangement of the defect complexes. The changes were used in a confocal luminescence microscope to image ferroelectric-domain structures.

AB - The role of defects within the domain inversion process in ferroelectric LiNbO3 crystals was studied by investigating the optical properties of intentionally introduced Er3+ defect complexes. Drastic differences in the Er3+ emission were found using site-selective excitation-emission spectroscopy, which were due to a rearrangement of the defect complexes. The changes were used in a confocal luminescence microscope to image ferroelectric-domain structures.

UR - http://www.scopus.com/inward/record.url?scp=0037442461&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0037442461&partnerID=8YFLogxK

U2 - 10.1063/1.1538333

DO - 10.1063/1.1538333

M3 - Article

AN - SCOPUS:0037442461

SN - 0021-8979

VL - 93

SP - 2295

EP - 2297

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 4

ER -

Ferroelectric domain imaging by defect-luminescence microscopy

Abstract

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