Ferroelectric domain imaging by defect-luminescence microscopy

V. Dierolf; C. Sandmann; S. Kim; V. Gopalan; K. Polgar

doi:10.1063/1.1538333

Ferroelectric domain imaging by defect-luminescence microscopy

V. Dierolf, C. Sandmann, S. Kim, V. Gopalan, K. Polgar

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45 Scopus citations

Abstract

The role of defects within the domain inversion process in ferroelectric LiNbO₃ crystals was studied by investigating the optical properties of intentionally introduced Er³⁺ defect complexes. Drastic differences in the Er³⁺ emission were found using site-selective excitation-emission spectroscopy, which were due to a rearrangement of the defect complexes. The changes were used in a confocal luminescence microscope to image ferroelectric-domain structures.

Original language	English (US)
Pages (from-to)	2295-2297
Number of pages	3
Journal	Journal of Applied Physics
Volume	93
Issue number	4
DOIs	https://doi.org/10.1063/1.1538333
State	Published - Feb 15 2003

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

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10.1063/1.1538333

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title = "Ferroelectric domain imaging by defect-luminescence microscopy",

abstract = "The role of defects within the domain inversion process in ferroelectric LiNbO3 crystals was studied by investigating the optical properties of intentionally introduced Er3+ defect complexes. Drastic differences in the Er3+ emission were found using site-selective excitation-emission spectroscopy, which were due to a rearrangement of the defect complexes. The changes were used in a confocal luminescence microscope to image ferroelectric-domain structures.",

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AU - Gopalan, V.

AU - Polgar, K.

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AB - The role of defects within the domain inversion process in ferroelectric LiNbO3 crystals was studied by investigating the optical properties of intentionally introduced Er3+ defect complexes. Drastic differences in the Er3+ emission were found using site-selective excitation-emission spectroscopy, which were due to a rearrangement of the defect complexes. The changes were used in a confocal luminescence microscope to image ferroelectric-domain structures.

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Ferroelectric domain imaging by defect-luminescence microscopy

Abstract

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