FLAW: FPGA lifetime awareness

Keyphrases

• Field Programmable Gate Array 100%
• Physical Phenomena 50%
• Vulnerability 50%
• Aging 50%
• Novel Technique 50%
• Performance Degradation 50%
• Adverse Impact 50%
• Microarchitecture 50%
• VLSI Circuits 50%
• Permanent Failure 50%
• Electromigration 50%
• Hard Errors 50%
• Transient Error 50%
• Time-dependent Dielectric Breakdown 50%
• Permanent Damage 50%

Computer Science

• Field Programmable Gate Arrays 100%
• Performance Degradation 33%
• Microarchitecture 33%
• Physical Phenomena 33%
• Adverse Impact 33%