TY - JOUR
T1 - Flaw Identification in Additively Manufactured Parts Using X-ray Computed Tomography and Destructive Serial Sectioning
AU - Sundar, Veeraraghavan
AU - Snow, Zackary
AU - Keist, Jayme
AU - Jones, Griffin
AU - Reed, Rachel
AU - Reutzel, Edward
N1 - Publisher Copyright:
© 2021, ASM International.
PY - 2021/7
Y1 - 2021/7
N2 - In additive manufacturing (AM), internal flaws that form during processing can have a detrimental impact on the resulting fatigue behavior of the component. Nondestructive x-ray computed tomography (XCT) has been routinely used to inspect AM components. This technique, however, is limited by what is resolvable as well as the automated procedures available to analyze the data. In this study, we compared XCT scans and automated flaw recognition analysis of the corresponding data to results obtained from an automated mechanical polishing-based serial sectioning system. Although internal porosity and surface roughness were easily observed by serial sectioning with bright-field optical microscopy, the same level of information could not be obtained from the XCT data. For the acquisition parameters used, XCT had only a 15.7% detection rate compared to that of serial sectioning. The results point to the need to recognize the limitations of XCT and for supplementary XCT scan quality metrics in addition to the voxel size.
AB - In additive manufacturing (AM), internal flaws that form during processing can have a detrimental impact on the resulting fatigue behavior of the component. Nondestructive x-ray computed tomography (XCT) has been routinely used to inspect AM components. This technique, however, is limited by what is resolvable as well as the automated procedures available to analyze the data. In this study, we compared XCT scans and automated flaw recognition analysis of the corresponding data to results obtained from an automated mechanical polishing-based serial sectioning system. Although internal porosity and surface roughness were easily observed by serial sectioning with bright-field optical microscopy, the same level of information could not be obtained from the XCT data. For the acquisition parameters used, XCT had only a 15.7% detection rate compared to that of serial sectioning. The results point to the need to recognize the limitations of XCT and for supplementary XCT scan quality metrics in addition to the voxel size.
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U2 - 10.1007/s11665-021-05567-w
DO - 10.1007/s11665-021-05567-w
M3 - Article
AN - SCOPUS:85111789510
SN - 1059-9495
VL - 30
SP - 4958
EP - 4964
JO - Journal of Materials Engineering and Performance
JF - Journal of Materials Engineering and Performance
IS - 7
ER -