Focused ion beam (FIB) preparation and electron microscopy analysis of individual microbolometer pixels

M. Olszta; J. Dougherty; M. Horn; E. C. Dickey

doi:10.1017/S1431927606068747

Focused ion beam (FIB) preparation and electron microscopy analysis of individual microbolometer pixels

M. Olszta, J. Dougherty, M. Horn, E. C. Dickey

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	1270-1271
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606068747
State	Published - Aug 2006

All Science Journal Classification (ASJC) codes

Instrumentation

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title = "Focused ion beam (FIB) preparation and electron microscopy analysis of individual microbolometer pixels",

author = "M. Olszta and J. Dougherty and M. Horn and Dickey, {E. C.}",

year = "2006",

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language = "English (US)",

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AU - Olszta, M.

AU - Dougherty, J.

AU - Horn, M.

AU - Dickey, E. C.

PY - 2006/8

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Focused ion beam (FIB) preparation and electron microscopy analysis of individual microbolometer pixels

All Science Journal Classification (ASJC) codes

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