Focused ion beam (FIB) preparation and electron microscopy analysis of individual microbolometer pixels

M. Olszta, J. Dougherty, M. Horn, E. C. Dickey

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)1270-1271
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Aug 2006

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this