Focused ion beam (FIB) preparation and electron microscopy analysis of individual microbolometer pixels

M. Olszta; J. Dougherty; M. Horn; E. C. Dickey

doi:10.1017/S1431927606068747

Focused ion beam (FIB) preparation and electron microscopy analysis of individual microbolometer pixels

M. Olszta
, J. Dougherty
, M. Horn
, E. C. Dickey

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	1270-1271
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606068747
State	Published - Aug 2006

All Science Journal Classification (ASJC) codes

Instrumentation

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title = "Focused ion beam (FIB) preparation and electron microscopy analysis of individual microbolometer pixels",

author = "M. Olszta and J. Dougherty and M. Horn and Dickey, \{E. C.\}",

year = "2006",

month = aug,

doi = "10.1017/S1431927606068747",

language = "English (US)",

volume = "12",

pages = "1270--1271",

journal = "Microscopy and Microanalysis",

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publisher = "Oxford University Press",

number = "SUPPL. 2",

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T1 - Focused ion beam (FIB) preparation and electron microscopy analysis of individual microbolometer pixels

AU - Olszta, M.

AU - Dougherty, J.

AU - Horn, M.

AU - Dickey, E. C.

PY - 2006/8

Y1 - 2006/8

UR - https://www.scopus.com/pages/publications/33750876005

UR - https://www.scopus.com/pages/publications/33750876005#tab=citedBy

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DO - 10.1017/S1431927606068747

M3 - Article

AN - SCOPUS:33750876005

SN - 1431-9276

VL - 12

SP - 1270

EP - 1271

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Focused ion beam (FIB) preparation and electron microscopy analysis of individual microbolometer pixels

All Science Journal Classification (ASJC) codes

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