Keyphrases
Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS)
100%
Matrix Deposition
100%
Mass Spectrometry Imaging
100%
Sample Preparation
50%
Electron Microscopy
50%
In Vacuo
50%
Bombardment
50%
Spatial Resolution
50%
Cluster Bombardment
50%
Surface Water
50%
Sublimation
50%
Quality Spectra
50%
Surface Layer
50%
Cell Morphology
50%
C60+
50%
Surface Environment
50%
Static SIMS
50%
SIMS Analysis
50%
Characteristic Fragments
50%
Chemistry
Time-of-Flight Secondary Ion Mass Spectrometry
100%
Secondary Ion Mass Spectroscopy
100%
Imaging Mass Spectrometry
100%
Electron Microscopy
50%
Cluster Ion
50%
Ion Bombardment
50%
Surface Water
50%
Engineering
Time-of-Flight
100%
Surface Water
50%
Bombardment
50%
Spatial Resolution
50%
Ion Implantation
50%
Surface Layer
50%
Cell Morphology
50%
Medicine and Dentistry
Secondary Ion Mass Spectrometry
100%
Mass Spectrometry Imaging
100%
Electron Microscopy
25%
Surface Water
25%
Material Science
Secondary Ion Mass Spectrometry
100%
Electron Microscopy
25%
Ion Implantation
25%
Neuroscience
Mass Spectrometry
100%
Electron Microscopy
50%