Abstract
We employ atomic force microscope-based frequency shift microscopy to study the electronic properties of quantum dots formed in carbon nanotubes. The nontransport detection scheme of frequency shift allows us to probe nearly isolated quantum dots in a few electron regime. At 4 K, we observe Coulomb oscillations of quantum dots with single-electron resolution and extract the charging energy of a quantum dot.
Original language | English (US) |
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Article number | 242102 |
Pages (from-to) | 1-3 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 87 |
Issue number | 24 |
DOIs | |
State | Published - 2005 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)