TY - JOUR
T1 - Frequency shift of thickness-shear vibrations of AT-cut quartz resonators due to a liquid layer with the electrode stiffness considered
AU - Jing, Yun
AU - Chen, Jin
AU - Chen, Xiao
AU - Gong, Xun
N1 - Funding Information:
The authors thank Dennis James Le Boeuf for many helpful suggestions. This work was partially supported by the Natural Science Foundation of China (10404014).
Funding Information:
Manuscript received November 23, 2006; accepted February 23, 2007. This work was supported in part by the State Natural Science Fund Program No. 10404014. Y. Jing was with the Institute of Acoustics, Nanjing University, Nanjing, Jiangsu 210093, China, and is currently with Rensselaer Polytechnic Institute, Troy, NY 12180 (e-mail: [email protected]). J. Chen and X. Gong are with the Institute of Acoustics, the Department of Electronic Science and Engineering, Nanjing University, Nanjing, Jiangsu 210093, China. X. Chen is with the Department of Physics, Nanjing University, Nanjing, Jiangsu 210093, China. Digital Object Identifier 10.1109/TUFFC.2007.389
PY - 2007/7
Y1 - 2007/7
N2 - Thickness-shear vibrations of an AT-cut quartz resonator due to a liquid layer are studied. Closed form solutions are obtained with electrodes considered. Effect of the shear stiffness of electrodes on frequency shifts is presented.
AB - Thickness-shear vibrations of an AT-cut quartz resonator due to a liquid layer are studied. Closed form solutions are obtained with electrodes considered. Effect of the shear stiffness of electrodes on frequency shifts is presented.
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U2 - 10.1109/TUFFC.2007.389
DO - 10.1109/TUFFC.2007.389
M3 - Article
C2 - 17718318
AN - SCOPUS:34547459016
SN - 0885-3010
VL - 54
SP - 1290
EP - 1292
JO - IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
JF - IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
IS - 7
ER -