Fundamental studies of the cluster ion bombardment of water ice

Christopher Szakal, Joseph Kozole, Nicholas Winograd

Research output: Contribution to journalArticlepeer-review

16 Scopus citations


The fundamental sputtering properties of water ice are of interest for molecular depth profiling of biological samples in their native environment. We report on a method of studying amorphous water ice films of precise thicknesses in which pure water vapor is condensed onto a pre-cooled, silver-coated quartz crystal microbalance (QCM). This scheme allows for the determination of water ice sputter yields for any primary projectile as well as providing a means for studying escape depths of atoms and molecules beneath the deposited water ice layer. Specifically, we find a removal of approximately 2500 water molecule equivalents/20 keV C 60 + projectile with an underlying silver ion escape depth of 7.0 Å.

Original languageEnglish (US)
Pages (from-to)6526-6528
Number of pages3
JournalApplied Surface Science
Issue number19
StatePublished - Jul 30 2006

All Science Journal Classification (ASJC) codes

  • General Chemistry
  • Condensed Matter Physics
  • General Physics and Astronomy
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films


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