Geometrically nonlinear stress-deflection relations for thin film/substrate systems

Christine B. Masters, N. J. Salamon

Research output: Contribution to journalArticlepeer-review

100 Scopus citations


A previously developed geometrically nonlinear stress-curvature relation is expanded in this paper to allow for a less restrictive approximation of the midplane strains in a thin film/substrate system. The previous analysis is based on a minimization of the total strain energy and predicts a bifurcation in shape as the magnitude of intrinsic film stress increases. It is reviewed here and three new cases are presented. Expanding the approximating polynomials for the normal midplane strains ε0x and ε0y, has a small effect on the solution. However, allowing the midplane shear strain, γ0xy, to be nonzero has a pronounced effect on the solution, particularly in the stress region near the bifurcation point.

Original languageEnglish (US)
Pages (from-to)915-925
Number of pages11
JournalInternational Journal of Engineering Science
Issue number6
StatePublished - Jun 1993

All Science Journal Classification (ASJC) codes

  • General Materials Science
  • General Engineering
  • Mechanics of Materials
  • Mechanical Engineering


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