Skip to main navigation
Skip to search
Skip to main content
Penn State Home
Help & FAQ
Home
Researchers
Research output
Research units
Equipment
Grants & Projects
Prizes
Activities
Search by expertise, name or affiliation
Goodness-of-fit testing: The thresholding approach
Min Hee Kim, Michael G. Akritas
Statistics
Research output
:
Contribution to journal
›
Article
›
peer-review
1
Scopus citations
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Goodness-of-fit testing: The thresholding approach'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Mathematics
Goodness of fit
85%
Chi-squared test
77%
Testing
58%
Statistics
56%
Contingency Table
45%
Wavelet Transformation
32%
Signal-to-noise Ratio
26%
Fourier Transformation
26%
Multiple Testing
25%
Alternatives
25%
Optimal Rates
24%
Asymptotic Efficiency
24%
Enhancement
24%
Type I Error Rate
24%
Goodness of Fit Test
22%
Asymptotic Normality
19%
Central limit theorem
19%
Statistic
18%
Tend
15%
Cell
15%
Infinity
14%
Simulation
13%
Interval
12%
Class
6%
Business & Economics
Goodness of Fit
94%
Testing
69%
Statistics
61%
Chi-square Test
60%
Contingency Table
52%
Central Limit Theorem
28%
Asymptotic Efficiency
23%
Asymptotic Normality
22%
Goodness of Fit Test
22%
Type I Error
21%
Wavelets
19%
Enhancement
16%
Alternatives
15%
Empirical Investigation
13%
Simulation
11%