Abstract
Transmission electron microscopy (TEM) observations during in situ ion irradiation were used to study grain growth in free-standing Zr-Fe thin film multilayers at 25 and 300 K. Irradiations were performed with three different types of ions: 100 keV Ar, 300 keV Kr and 500 keV Xe ions to fluences of 3 × 1015 ion cm-2. Grain growth during irradiation at 20 K occurs at a similar rate to that at 300 K. At both temperatures the grain growth rate was proportional to the total number of displacements, regardless of the ion used for the irradiation. We discuss these results in terms of two previous models for grain growth under irradiation.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 521-525 |
| Number of pages | 5 |
| Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
| Volume | 175-177 |
| DOIs | |
| State | Published - Apr 2001 |
| Event | 12th International Conference on Ion Beam Modification of Materials - Rio Grande do Sul, Brazil Duration: Sep 3 2000 → Sep 8 2000 |
All Science Journal Classification (ASJC) codes
- Nuclear and High Energy Physics
- Instrumentation
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