Grazing-incidence X-ray scattering of plant epidermal cell wall

Joshua T. Del Mundo, Enrique D. Gomez, Esther W. Gomez

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

Diffraction studies are invaluable for examining polysaccharide structure and assembly. X-ray diffraction (XRD) in reflection mode can be used to determine the crystalline structure of bulk materials. However, generation of enough sample material mass can limit the application of XRD because several milligrams of sample may be required. This can be difficult to procure for materials such as lab-grown plant tissues. Alternatively, grazing-incidence X-ray scattering (GIXS) using a 2D area detector enables improvement of signal-to-noise ratios for thin film samples (<1μm in thickness) or when working with a very small sample volume. This chapter provides a protocol for performing GIXS of plant epidermal cell walls.

Original languageEnglish (US)
Title of host publicationAdvanced Biophysical Techniques for Polysaccharides Characterization
PublisherElsevier
Pages221-234
Number of pages14
ISBN (Electronic)9780443140426
ISBN (Print)9780443140433
DOIs
StatePublished - Jan 1 2024

All Science Journal Classification (ASJC) codes

  • General Biochemistry, Genetics and Molecular Biology

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