Abstract
Diffraction studies are invaluable for examining polysaccharide structure and assembly. X-ray diffraction (XRD) in reflection mode can be used to determine the crystalline structure of bulk materials. However, generation of enough sample material mass can limit the application of XRD because several milligrams of sample may be required. This can be difficult to procure for materials such as lab-grown plant tissues. Alternatively, grazing-incidence X-ray scattering (GIXS) using a 2D area detector enables improvement of signal-to-noise ratios for thin film samples (<1μm in thickness) or when working with a very small sample volume. This chapter provides a protocol for performing GIXS of plant epidermal cell walls.
Original language | English (US) |
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Title of host publication | Advanced Biophysical Techniques for Polysaccharides Characterization |
Publisher | Elsevier |
Pages | 221-234 |
Number of pages | 14 |
ISBN (Electronic) | 9780443140426 |
ISBN (Print) | 9780443140433 |
DOIs | |
State | Published - Jan 1 2024 |
All Science Journal Classification (ASJC) codes
- General Biochemistry, Genetics and Molecular Biology