Growth and Characterization of Metal(II) Alkanebisphosphonate Multilayer Thin Films on Gold Surfaces

Huey C. Yang; Katsunori Aoki; Hun Gi Hong; Debra D. Sackett; Mark F. Arendt; Shueh Lin Yau; Christine M. Bell; Thomas E. Mallouk

doi:10.1021/ja00078a025

Growth and Characterization of Metal(II) Alkanebisphosphonate Multilayer Thin Films on Gold Surfaces

Huey C. Yang, Katsunori Aoki, Hun Gi Hong, Debra D. Sackett, Mark F. Arendt, Shueh Lin Yau, Christine M. Bell, Thomas E. Mallouk

Research output: Contribution to journal › Article › peer-review

193 Scopus citations

Abstract

Thin films of divalent metal (Zn and Cu) alkanebisphosphonates grow on gold surfaces modified with (4-mercaptobutyl)phosphonic acid by alternate immersion in 5 mM ethanolic solutions of the metal acetate or perchlorate salt and H₂O₃P(CH₂)_nP0₃H₂, n = 8, 10, 12, and 14. Growth of each layer is remarkably fast. Well-ordered multilayers can be deposited with 10-min adsorption steps, and films of 100-layer thickness are easily prepared. Quartz crystal microbalance (QCM) measurements of mass changes are in quantitative agreement with adsorption of individual layers corresponding to bulk stoichiometry (M₂ [O₃P(CH₂)_nPO₃]· 2H₂O) and packing density. Ellipsometric film thicknesses agree closely with measured layer spacings from X-ray diffraction of bulk solids, and alkyl chain tilt angles (31°) for the Zn films are essentially the same as predicted from the crystal structure of Fe(O₃PC₂H₅)· H₂O. Reflectance infrared spectra show that the alkyl chains are less ordered in the films than in the bulk solids for M₂[O₃P(CH₂)_nPO₃]·2H₂O, n = 8, but that they are well-ordered for n = 14. Atomic force microscopy (AFM) images of multilayer films show that they follow the surface topology of the underlying gold and that they can be mechanically removed from the substrate. The depth of etch pits prepared with the AFM tip matches the film thickness measured by ellipsometry.

Original language	English (US)
Pages (from-to)	11855-11862
Number of pages	8
Journal	Journal of the American Chemical Society
Volume	115
Issue number	25
DOIs	https://doi.org/10.1021/ja00078a025
State	Published - Dec 1 1993

All Science Journal Classification (ASJC) codes

Catalysis
General Chemistry
Biochemistry
Colloid and Surface Chemistry

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10.1021/ja00078a025

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@article{b1948e28f02541f6ae45334621c261b8,

title = "Growth and Characterization of Metal(II) Alkanebisphosphonate Multilayer Thin Films on Gold Surfaces",

abstract = "Thin films of divalent metal (Zn and Cu) alkanebisphosphonates grow on gold surfaces modified with (4-mercaptobutyl)phosphonic acid by alternate immersion in 5 mM ethanolic solutions of the metal acetate or perchlorate salt and H2O3P(CH2)nP03H2, n = 8, 10, 12, and 14. Growth of each layer is remarkably fast. Well-ordered multilayers can be deposited with 10-min adsorption steps, and films of 100-layer thickness are easily prepared. Quartz crystal microbalance (QCM) measurements of mass changes are in quantitative agreement with adsorption of individual layers corresponding to bulk stoichiometry (M2 [O3P(CH2)nPO3]· 2H2O) and packing density. Ellipsometric film thicknesses agree closely with measured layer spacings from X-ray diffraction of bulk solids, and alkyl chain tilt angles (31°) for the Zn films are essentially the same as predicted from the crystal structure of Fe(O3PC2H5)· H2O. Reflectance infrared spectra show that the alkyl chains are less ordered in the films than in the bulk solids for M2[O3P(CH2)nPO3]·2H2O, n = 8, but that they are well-ordered for n = 14. Atomic force microscopy (AFM) images of multilayer films show that they follow the surface topology of the underlying gold and that they can be mechanically removed from the substrate. The depth of etch pits prepared with the AFM tip matches the film thickness measured by ellipsometry.",

author = "Yang, {Huey C.} and Katsunori Aoki and Hong, {Hun Gi} and Sackett, {Debra D.} and Arendt, {Mark F.} and Yau, {Shueh Lin} and Bell, {Christine M.} and Mallouk, {Thomas E.}",

year = "1993",

month = dec,

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doi = "10.1021/ja00078a025",

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journal = "Journal of the American Chemical Society",

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T1 - Growth and Characterization of Metal(II) Alkanebisphosphonate Multilayer Thin Films on Gold Surfaces

AU - Yang, Huey C.

AU - Aoki, Katsunori

AU - Hong, Hun Gi

AU - Sackett, Debra D.

AU - Arendt, Mark F.

AU - Yau, Shueh Lin

AU - Bell, Christine M.

AU - Mallouk, Thomas E.

PY - 1993/12/1

Y1 - 1993/12/1

N2 - Thin films of divalent metal (Zn and Cu) alkanebisphosphonates grow on gold surfaces modified with (4-mercaptobutyl)phosphonic acid by alternate immersion in 5 mM ethanolic solutions of the metal acetate or perchlorate salt and H2O3P(CH2)nP03H2, n = 8, 10, 12, and 14. Growth of each layer is remarkably fast. Well-ordered multilayers can be deposited with 10-min adsorption steps, and films of 100-layer thickness are easily prepared. Quartz crystal microbalance (QCM) measurements of mass changes are in quantitative agreement with adsorption of individual layers corresponding to bulk stoichiometry (M2 [O3P(CH2)nPO3]· 2H2O) and packing density. Ellipsometric film thicknesses agree closely with measured layer spacings from X-ray diffraction of bulk solids, and alkyl chain tilt angles (31°) for the Zn films are essentially the same as predicted from the crystal structure of Fe(O3PC2H5)· H2O. Reflectance infrared spectra show that the alkyl chains are less ordered in the films than in the bulk solids for M2[O3P(CH2)nPO3]·2H2O, n = 8, but that they are well-ordered for n = 14. Atomic force microscopy (AFM) images of multilayer films show that they follow the surface topology of the underlying gold and that they can be mechanically removed from the substrate. The depth of etch pits prepared with the AFM tip matches the film thickness measured by ellipsometry.

AB - Thin films of divalent metal (Zn and Cu) alkanebisphosphonates grow on gold surfaces modified with (4-mercaptobutyl)phosphonic acid by alternate immersion in 5 mM ethanolic solutions of the metal acetate or perchlorate salt and H2O3P(CH2)nP03H2, n = 8, 10, 12, and 14. Growth of each layer is remarkably fast. Well-ordered multilayers can be deposited with 10-min adsorption steps, and films of 100-layer thickness are easily prepared. Quartz crystal microbalance (QCM) measurements of mass changes are in quantitative agreement with adsorption of individual layers corresponding to bulk stoichiometry (M2 [O3P(CH2)nPO3]· 2H2O) and packing density. Ellipsometric film thicknesses agree closely with measured layer spacings from X-ray diffraction of bulk solids, and alkyl chain tilt angles (31°) for the Zn films are essentially the same as predicted from the crystal structure of Fe(O3PC2H5)· H2O. Reflectance infrared spectra show that the alkyl chains are less ordered in the films than in the bulk solids for M2[O3P(CH2)nPO3]·2H2O, n = 8, but that they are well-ordered for n = 14. Atomic force microscopy (AFM) images of multilayer films show that they follow the surface topology of the underlying gold and that they can be mechanically removed from the substrate. The depth of etch pits prepared with the AFM tip matches the film thickness measured by ellipsometry.

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ER -

Growth and Characterization of Metal(II) Alkanebisphosphonate Multilayer Thin Films on Gold Surfaces

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