Growth and characterization of Pb(Mg_1/3Nb_2/3)O₃ and Pb(Mg_1/3Nb_2/3)O₃-PbTiO₃ thin films using solid source MOCVD techniques

Keyphrases

• Metal-organic Chemical Vapor Deposition (MOCVD) 100%
• Solid Source 100%
• Dielectric Constant 100%
• PbTiO3 Thin Film 100%
• SrRuO3 100%
• Source Material 50%
• Electrical Properties 50%
• PbTiO3 50%
• SrTiO3 50%
• Epitaxial 50%
• Thick Film 50%
• SrTiO3 Single Crystal 50%
• Electrode Layer 50%
• Epitaxial Thin Film 50%
• Bottom Electrode 50%
• Property Measurement 50%
• Single-crystal Substrate 50%
• Premixed 50%
• Rutherford Backscattering 50%
• Dielectric Loss Factor 50%
• Pervoskite 50%

Material Science

• Film 100%
• Thin Films 100%
• Permittivity 40%
• X-Ray Diffraction 20%
• Single Crystal 20%
• Dielectric Material 20%
• Thick Films 20%

Engineering

• Thin Films 100%
• Granulocyte 100%
• Dielectrics 40%
• Source Material 20%
• Dielectric Loss 20%
• Loss Factor 20%