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Growth and reliability of thick gate oxide in U-trench for power MOSFET's
C. T. Wu, R. S. Ridley, G. Dolny, T. Grebs, C. Knoedler, S. Suliman, B. Venkataraman, O. Awadelkarim, J. Ruzyllo
Research output: Contribution to conference › Paper › peer-review
5
Scopus
citations