Growth and structural properties of Bi(FexSc1-x)O3 thin films

M. Murakami, M. A. Aronova, M. Wuttig, I. Takeuchi, S. Trolier-Mckinstry, K. McDonald, E. Knoesel, S. E. Lofland, T. Chikyow, T. Aoyama, K. Nakajima

Research output: Contribution to journalArticlepeer-review

3 Scopus citations


Epitaxial Bi(FexSc1-x)O3 thin films with a range of compositions were fabricated by pulsed laser deposition on SrTiO3 (001) substrates with a BiFeO3 buffer layer. X-ray diffraction and transmission electron microscopy reveal that this composition series forms a solid solution in the thin film form. Second harmonic generation measurements showed a maximum at x = 0.7, which may be associated with a phase transition. The present BiScO3 films did not exhibit ferroelectric or antiferroelectric behaviour at the field levels which could be probed.

Original languageEnglish (US)
Pages (from-to)241-247
Number of pages7
JournalPhilosophical Magazine Letters
Issue number3-4
StatePublished - Mar 2007

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics


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