Growth kinetics study in halide chemical vapor deposition of SiC

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    Abstract

    Growth rates of high-purity single-crystal 6H-SiC have been studied as a function of growth conditions during chemical vapor deposition process using silicon tetrachloride, propane, and hydrogen as reactants. The growth temperature ranged from 2000 to 2150 °C. High-quality SiC crystals were deposited at growth rates in the 100-300 μm/h range in both silicon- and carbon-supply limited regimes by adjusting flows of all three reactants. The results have been interpreted using thermodynamic equilibrium calculations.

    Original languageEnglish (US)
    Pages (from-to)112-122
    Number of pages11
    JournalJournal of Crystal Growth
    Volume284
    Issue number1-2
    DOIs
    StatePublished - Oct 15 2005

    All Science Journal Classification (ASJC) codes

    • Condensed Matter Physics
    • Inorganic Chemistry
    • Materials Chemistry

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