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Growth of wurtzite ferroelectrics

  • Simon Fichtner
  • , Masato Uehara
  • , Isabel Streicher
  • , Samuel Yang
  • , Jon Paul Maria
  • , Zetian Mi
  • , Stefano Leone
  • , Hiroshi Funakubo

Research output: Contribution to journalReview articlepeer-review

Abstract

Abstract: Thin films with wurtzite crystal structure feature some of the best compatibility with the major semiconductor platforms among ferroelectrics, as well as high remanent polarization, excellent stability, and scalability; making them very attractive for microelectronics applications ranging from memories to sensors and actuators. Their intrinsic functionality, which enables these applications directly links device performance to the underlying growth processes. This article gives an overview of the three main deposition methods for the material class (sputtering, molecular beam epitaxy, metal–organic chemical vapor deposition), their individual advantages as well as how they can contribute to solving the main challenges that remain to be overcome in order to bring wurtzite ferroelectrics to large-scale applications. Furthermore, it differentiates the growth of wurtzite ferroelectrics from that of more established thin-film ferroelectrics.

Original languageEnglish (US)
Pages (from-to)1079-1093
Number of pages15
JournalMRS Bulletin
Volume50
Issue number9
DOIs
StatePublished - Sep 2025

All Science Journal Classification (ASJC) codes

  • General Materials Science
  • Condensed Matter Physics
  • Physical and Theoretical Chemistry

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