@article{a38cf5b950b54368b7a1dd23d4061cc2,
title = "Guest Editorial Celebrating 75 Years of Excellence: The Enduring Legacy and Future Outlook of the IEEE Reliability Society",
author = "Jason Rupe and Phil Laplante and Shieh, \{Shiuhpyng Winston\}",
year = "2024",
month = mar,
day = "1",
doi = "10.1109/TR.2024.3366027",
language = "English (US)",
volume = "73",
pages = "3--6",
journal = "IEEE Transactions on Reliability",
issn = "0018-9529",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "1",
}