High field tunneling as a limiting factor of maximum energy density in dielectric energy storage capacitors

Qin Chen; Yong Wang; Xin Zhou; Q. M. Zhang; Shihai Zhang

doi:10.1063/1.2903115

High field tunneling as a limiting factor of maximum energy density in dielectric energy storage capacitors

Qin Chen, Yong Wang, Xin Zhou, Q. M. Zhang, Shihai Zhang

Electrical Engineering

Research output: Contribution to journal › Article › peer-review

117 Scopus citations

Abstract

In several low loss dielectric materials, it was observed that the energy loss remains very small under low and medium electric fields but dramatically increases at high field which is believed to be due to tunneling current. The increase of tunneling current at high field is due to the decrease of barrier width and height and is a universal phenomenon in all dielectric materials. Due to the requirement of high energy efficiency, high field conduction places a limit for the maximum operation field, which could be lower than the breakdown field and act as the limiting factor of energy density.

Original language	English (US)
Article number	142909
Journal	Applied Physics Letters
Volume	92
Issue number	14
DOIs	https://doi.org/10.1063/1.2903115
State	Published - 2008

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.2903115

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title = "High field tunneling as a limiting factor of maximum energy density in dielectric energy storage capacitors",

abstract = "In several low loss dielectric materials, it was observed that the energy loss remains very small under low and medium electric fields but dramatically increases at high field which is believed to be due to tunneling current. The increase of tunneling current at high field is due to the decrease of barrier width and height and is a universal phenomenon in all dielectric materials. Due to the requirement of high energy efficiency, high field conduction places a limit for the maximum operation field, which could be lower than the breakdown field and act as the limiting factor of energy density.",

author = "Qin Chen and Yong Wang and Xin Zhou and Zhang, {Q. M.} and Shihai Zhang",

note = "Funding Information: We greatly appreciate the financial support of this work by ONR through Grant Nos. N00014-05-1-0541 (MURI) and N00014-08-1-0229. This publication was supported by the Pennsylvania State University Materials Research Institute Nano Fabrication Network and the National Science Foundation Cooperative Agreement No. 0335765, National Nanotechnology Infrastructure Network, with Cornell University.",

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doi = "10.1063/1.2903115",

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volume = "92",

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T1 - High field tunneling as a limiting factor of maximum energy density in dielectric energy storage capacitors

AU - Chen, Qin

AU - Wang, Yong

AU - Zhou, Xin

AU - Zhang, Q. M.

AU - Zhang, Shihai

N1 - Funding Information: We greatly appreciate the financial support of this work by ONR through Grant Nos. N00014-05-1-0541 (MURI) and N00014-08-1-0229. This publication was supported by the Pennsylvania State University Materials Research Institute Nano Fabrication Network and the National Science Foundation Cooperative Agreement No. 0335765, National Nanotechnology Infrastructure Network, with Cornell University.

PY - 2008

Y1 - 2008

N2 - In several low loss dielectric materials, it was observed that the energy loss remains very small under low and medium electric fields but dramatically increases at high field which is believed to be due to tunneling current. The increase of tunneling current at high field is due to the decrease of barrier width and height and is a universal phenomenon in all dielectric materials. Due to the requirement of high energy efficiency, high field conduction places a limit for the maximum operation field, which could be lower than the breakdown field and act as the limiting factor of energy density.

AB - In several low loss dielectric materials, it was observed that the energy loss remains very small under low and medium electric fields but dramatically increases at high field which is believed to be due to tunneling current. The increase of tunneling current at high field is due to the decrease of barrier width and height and is a universal phenomenon in all dielectric materials. Due to the requirement of high energy efficiency, high field conduction places a limit for the maximum operation field, which could be lower than the breakdown field and act as the limiting factor of energy density.

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High field tunneling as a limiting factor of maximum energy density in dielectric energy storage capacitors

Abstract

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