High frequency permittivity determination by spectra simulation and measurement of microstrip ring resonators

E. Semouchkina; W. Cao; M. Lanagan

doi:10.1049/el:20000717

High frequency permittivity determination by spectra simulation and measurement of microstrip ring resonators

E. Semouchkina, W. Cao, M. Lanagan

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

Abstract

The S₂₁ spectra of microstrip ring resonators have been measured experimentally and also computed using the finite-difference time-domain (FDTD) method. The dielectric constant of the substrate was determined by fitting the simulation results to the experimental data. The results are more self-consistent than those obtained using the Wheeler-Hammerstad method.

Original language	English (US)
Pages (from-to)	956-958
Number of pages	3
Journal	Electronics Letters
Volume	36
Issue number	11
DOIs	https://doi.org/10.1049/el:20000717
State	Published - May 25 2000

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

Access to Document

10.1049/el:20000717

Cite this

@article{273742bb5c92422e82b603449ce094d4,

title = "High frequency permittivity determination by spectra simulation and measurement of microstrip ring resonators",

abstract = "The S21 spectra of microstrip ring resonators have been measured experimentally and also computed using the finite-difference time-domain (FDTD) method. The dielectric constant of the substrate was determined by fitting the simulation results to the experimental data. The results are more self-consistent than those obtained using the Wheeler-Hammerstad method.",

author = "E. Semouchkina and W. Cao and M. Lanagan",

year = "2000",

month = may,

day = "25",

doi = "10.1049/el:20000717",

language = "English (US)",

volume = "36",

pages = "956--958",

journal = "Electronics Letters",

issn = "0013-5194",

publisher = "John Wiley & Sons Inc.",

number = "11",

}

TY - JOUR

T1 - High frequency permittivity determination by spectra simulation and measurement of microstrip ring resonators

AU - Semouchkina, E.

AU - Cao, W.

AU - Lanagan, M.

PY - 2000/5/25

Y1 - 2000/5/25

N2 - The S21 spectra of microstrip ring resonators have been measured experimentally and also computed using the finite-difference time-domain (FDTD) method. The dielectric constant of the substrate was determined by fitting the simulation results to the experimental data. The results are more self-consistent than those obtained using the Wheeler-Hammerstad method.

AB - The S21 spectra of microstrip ring resonators have been measured experimentally and also computed using the finite-difference time-domain (FDTD) method. The dielectric constant of the substrate was determined by fitting the simulation results to the experimental data. The results are more self-consistent than those obtained using the Wheeler-Hammerstad method.

UR - http://www.scopus.com/inward/record.url?scp=0005497375&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0005497375&partnerID=8YFLogxK

U2 - 10.1049/el:20000717

DO - 10.1049/el:20000717

M3 - Article

AN - SCOPUS:0005497375

SN - 0013-5194

VL - 36

SP - 956

EP - 958

JO - Electronics Letters

JF - Electronics Letters

IS - 11

ER -

High frequency permittivity determination by spectra simulation and measurement of microstrip ring resonators

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this